Nanoscale spatial mapping of mechanical properties through dynamic atomic force microscopy

• Zahra Abooalizadeh,
• Leszek Josef Sudak and
• Philip Egberts

Beilstein J. Nanotechnol. 2019, 10, 1332–1347, doi:10.3762/bjnano.10.132

• (CR) AFM; elastic modulus mapping; force modulation microscopy (FMM); highly oriented pyrolytic graphite (HOPG); mechanical properties; surface science; surface steps; Introduction In recent years, the study of the size-dependent properties of materials, and in particular those at the nanometer scale

Mapping mechanical properties of organic thin films by force-modulation microscopy in aqueous media

• Jianming Zhang,
• Zehra Parlak,
• Carleen M. Bowers,
• Terrence Oas and
• Stefan Zauscher

Beilstein J. Nanotechnol. 2012, 3, 464–474, doi:10.3762/bjnano.3.53

• atomic force microscopy; biomolecules; elastic modulus mapping; nanomechanical characterization; self-assembled monolayers; Introduction Mapping the mechanical properties, such as elastic modulus, friction, and adhesion of surfaces and thin films in aqueous (or liquid) environments with nanoscale